For the mobile phone market where technology is more and more complex and profits are getting thinner, the test must be fast, flexible and effective to ensure that the production line can reach the profitable batch. By using test instruments with advanced software and hardware and different test modes, various tests can be used. Mobile phones enable fast, accurate measurements to ensure the quality required for 3G products.
Today's wireless handsets require more precise and rigorous testing than ever before, and engineers responsible for ensuring the quality of wireless handsets on the production line require more than just precision. In view of the increasingly complex and profitable mobile phone market, the test must be fast, flexible and effective in order to ensure that the production line can reach a large volume that can meet market demand and maintain profit.
Test instruments with advanced hardware and software and different test modes enable fast and accurate measurements on a wide range of mobile phones, especially as new generation test equipment provides more detailed analysis while making testing faster and easier. Improve throughput and price/performance associated with manufacturing mobile phones.
In fact, advanced test instrumentation hardware and software allows engineers to implement some traditional R&D tests in a manufacturing environment. It is important to have deeper testing capabilities on the production line because these tests can identify potential problems or find a need to make minor adjustments to component tolerances.
In short, to ensure the quality required for third-generation products, simple pass/fail measurements are not enough unless you want to risk losing customers. Mobile phone manufacturers must carefully detect any errors that may affect a small number of components during the manufacturing process.
Figure 1: in loopback mode wide band CDMA handsets Test 2.
In order to detect very small changes in the wireless signal, the test instrument must be able to perform a fast analysis. The latest test platform integrates ASICs, unique DSP technology and CPUs for faster and more detailed measurements. In fact, most test instruments currently used to test wireless devices have at least three digital signal processors (DSPs), one for measuring signals and averaging, and the second for performing debug processing (allowing test instruments to be used) Base station emulator), third control display, front panel, computer interface and two other DSPs.
The speed and power consumption of the DSP are the two main factors that determine the test speed of the test instrument. Other factors include the internal bus speed connecting the three processors and the architecture and efficiency of the software.
Average advantageBecause these new platforms enable faster measurement of test instruments, these platforms enable averaging in the manufacturing process. The averaging operation requires multiple samples to be fetched and analyzed, so it takes more time, but it is worth it because it enhances repeatability. In turn, higher repeatability means more stringent specification requirements, which can give manufacturers more advantages. For example, higher repeatability allows for the use of low cost components, effectively reducing the cost of the consumer's mobile phone. In addition, higher repeatability improves yield and profitability.
The average demand depends on the particular measurement, the device under test (DUT), and the stability of the test and DUT results, as well as the wait time for the phone to reach a steady state after changing the phone's input or output power. In some cases, the average value required to achieve a stable, repeatable test will be as many as 20. Each measurement is an average of multiple measurements made on a single pulse, so each of the 20 averages will be an average of 20 pulses.
In the 20-average test case, the wideband CDMA handset in the test instrument was in test loopback mode 2 (Figure 1). The power control bit pattern is set to all 1, and the maximum output power of the phone is just below 24dBm. This is a mobile phone with a power class of 3. The specification requires a maximum output power of 24dBm and an error range of +1dBm to -3dBm.
The twenty average objects are transmit power, frequency error, and occupied bandwidth. The filtered power measurement is implemented by a root raised cosine filter, and its user equipment and Utran (UMTS Terrestrial Radio Access Network) are both configured on the receiver.
Measuring two mobile phones at a timeIn addition to time and money, space is also an important factor to consider in the production line. If a measuring instrument can achieve a greater function with the same size specifications, then it has a higher value. Recognizing this, test manufacturers have added some optional features to increase production test efficiency.
One of the option features that saves time, space, and money is parallel phone testing. With this feature, a tester can test two phones simultaneously, even if they use different wireless standards. This type of configuration can save up to 30% in cost by reducing power consumption, cabling requirements, and the number of instruments required, which not only increases throughput but also saves floor space.
In Figure 1, the test instrument has a wideband CDMA handset in test loopback mode 2. In addition, the power control bit pattern is set to all 1, and the maximum output power of the mobile phone is just below 24dBm. A total of twenty average objects are transmit power, frequency error, and occupied bandwidth.
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